VLSI Test Principles and Architectures: Design for Testability > 공학 특가할인

1 Introduction 1
2 Design for testability 37
3 Logic and fault simulation 105
4 Test generation 161
5 Logic built-in self-test 263
6 Test compression 341
7 Logic diagnosis 397
8 Memory testing and built-in self-test 461
9 Memory diagnosis and built-in self-repair 517
10 Boundary scan and core-based testing 557
11 Analog and mixed-signal testing 619
12 Test technology trends in the nanometer age 679